Santec Corp. has introduced the SPA-100 Swept Photonics Analyzer. The SPA-100, paired with the company’s tunable laser source, leverages optical frequency domain reflectometry (OFDR) to analyze fiber-optic and photonic devices for insertion loss and return loss with a spatial resolution of better than 5 µm.
The wide sweep range of the tunable laser and the high resolution of the SPA-100 – the highest available, Santec asserts – enables technicians to perform accurate analysis of small devices like silicon photonic circuits, fiber-optic components, and compact fiber-optic assemblies. The built-in software displays a trace that shows reflectance and loss events along the waveguide to support fault location as well as measurement of parameters such as waveguide length and refractive index.
Meanwhile, the SPA-100 system uses coherent detection technology to perform transmissive wavelength-dependent loss measurement as well with a dynamic range of better than 70 dB in a single scan, thus saving measurement time by obviating the need to change optical power meter ranges.
Finally, a patented proximity sensing function enables the fiber probe to sense the distance between the probe and the silicon wafer to facilitate the alignment process during the wafer-level characterization process in a silicon photonic chip production line.
Santec will display the SPA-100 will be displayed at OFC 2023 from March 7-9.
For related articles, visit the Test and Measurement Topic Center.
For more information on test equipment and suppliers, visit the Lightwave Buyer’s Guide.
To stay abreast of optical communications technology, subscribe to Lightwave’s Enabling Technologies Newsletter.
