MWIR WAVELENGTH with internal gas purge and cut filter
The AQ6376E is the latest version of our bench-top optical spectrum analyzer extending the wavelength coverage well beyond the NIR range of our previous models into the MWIR region from 1500 to 3400 nm.
Popular applications include the detection of gases such as carbon oxides (COx), nitrogen oxides (NOx), and hydrocarbon gas (CxHy) for environmental studies.
Similar to the long wavelength model, it offers the added benefits of gas purging input ports / output ports, a built-in cut filter for high order diffracted light, and a novel double speed mode which increases the sweep speed up to 2 times compared to the standard sweep mode.
Key feature summary
Purge feature
Due to the high resolution and sensitivity of the AQ6376E, it can actually detect the presence of water molecules in the air. The water vapor is detected in the upper Near-IR wavelength region and could overlap with or mask the spectral characteristics of the actual device under test in that particular region.
By continuously supplying a pure purge gas such as nitrogen to the monochromator through the ports on the back panel, the AQ6376E can reduce the influence of water vapor absorptions and provide more reliable and accurate measurements than ever before.
Built-in cut filter for high order diffracted light
Due to the diffractive technology used, the monochromator in some circumstances could generate high order diffracted light, which appears at wavelengths equal to the integral multiple of input wavelengths.
By cutting incoming light below 1500 nm with the built-in filter, the AQ6376E drastically reduces the influence of high order diffracted light on the measurement. Thus, the measured data are always reliable and replicate the real signal under test.
Double speed mode
Increases the sweep speed up to 2 times compared to the standard sweep mode, with only a 2 dB penalty to the standard sensitivity value.
The AQ6376E covers not only the wavelength span used in communications, but also the 3µm region which is used for environmental sensing, medical, biology and industrial applications.
The AQ6376E can measure optical power from +13dBm down to -65dBm thanks to its high-dynamic and very low noise components and circuits used for photo detection. This enables precise measurements of both high power and low power sources.
Measurement sensitivity can be chosen among 7 values according to the measurement speed required by the specific test to be performed.
The AQ6376E uses a double-pass monochromator structure to achieve high wavelength resolution (0.1 nm) and wide close-in dynamic range (55 dB). Thus, closely allocated signals and noise can be separately measured.
GREATER EFFICIENCY
High Speed Sweep
With a proprietary sweep technique the AQ6376E achieves a much faster sweep speed than conventional measurement systems, which use a monochromator. Max. sweep time is only 0.5 sec. for 100 nm span.
Fast command processing and data transfer
Applying a fast microprocessor, the AQ6376E achieves very fast command processing speed and Ethernet interface provides up to 100 times faster data transfer speed than GP-IB.
The AQ6376E uses a free-space optical input structure, i.e. no fiber is mounted inside the instrument.
This smart solution is:
The appplication mode (APP) transforms an OSA into a versatile machine dedicated to a device under test (DUT). APP mode provides a DUT-specific user interface that navigates the user from configuration settings to test result output without worrying with other OSA settings. The AQ6376E comes pre-installed with several standard applications including DFB-LD testing, FP-LD testing and SC light source testing. Additional optional applications are available for download from the Yokogawa Test&Measurement website.
