MAP Series FlexLight Dual-Objective Connector Microscope (mFVU-3000)

Designed to reduce test times while providing actionable feedback to minimize contamination during the manufacturing process.

Optical network connectivity integrity is critical as data rates increase to support AI and High-Performance Computing workloads. AI architectures rely on high-performance parallel optical connectors like MPO and next-generation VSFF formats which can have 12, 16, or 24 fibers. All fiber paths must be free of contamination and manufactured to exacting precision. Even the slightest impurity on fiber optic interfaces can severely degrade network efficiency. In manufacturing, such defects lead to test failures, lower yields, and increased costs. Accurate assessment of polish quality and the ability to distinguish between scratches and surface contaminants are essential for preserving performance and minimizing operational disruptions.

This advanced microscope provides dual 400X high-resolution magnification and 30X wide field of view, enhanced imaging speed, advanced imaging control and visualization, programmable lighting, automated inspection through REST API, and customizable reporting.  Magnetic quick-connect adapters with auto ID capability simplify setup.  This fully automated microscope is ideal for checking the conformity of connectors to IEC industry standards, testing both PC/APC connectors and ferrules from 1 to 64 fibers.

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