VeEX unveils MPM-600G module, for high-density 100G test via MPA Series Platform

Sept. 27, 2018
Test instrument developer VeEX Inc. has announced the MPM-600G 100G test module, which it asserts offers the highest port density available for R&D/SVT lab and manufacturing applications. The modules are housed in the company’s MPA Series Platform.

Test instrument developer VeEX Inc. has announced the MPM-600G 100G test module, which it asserts offers the highest port density available for R&D/SVT lab and manufacturing applications. The modules are housed in the company’s MPA Series Platform.

The QSFP28-based module supports six independent 100G/40G Ethernet or OTN transport tests. The MPA platform will accommodate two MPM-600G modules, thus delivering twelve 100G test ports in a 1RU package. Test capabilities include support of the OTUCn 1-6 extension of OTN transport rates for beyond 100 Gbps (OTN B100G).

“The MPM-600G module enables VeEX to address the needs of NEMs and service providers in the multi-port 100Gb/s space with a cost-effective and efficient test solution for high-density packet optical transport services and pluggable transceiver verification,” said Keith Cole, vice president of product marketing, NEMs for VeEX.

The MPA Series Platform enables simultaneous, multi-port, multiprotocol transport testing for Ethernet/IP, OTN, SONET/SDH, and Fibre Channel, with interfaces ranging from 10 Mbps to 400 Gbps. Test modules support such transceiver form factors as CFP8, QSFP28/QSFP+, CFP4, and SFP28/SFP+/SFP.

For related articles, visit the Test and Measurement Topic Center.

For more information on test instruments and suppliers, visit the Lightwave Buyer’s Guide.

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Stephen Hardy | Editorial Director and Associate Publisher

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