SEPTEMBER 12, 2007 — Luna Technologies, a division of Luna Innovations Inc., released the ELp optical vector analyzer (OVA) fiber-optic test platform. It is designed to characterize polarization properties of fiber-optic components for high-speed optical networks. The ELp provides an upgrade path to full vector analyzer. Visit Luna at ECOC Booth 14008, September 17–19 in Berlin.
It uses the industry standard to measure polarization mode dispersion (PMD) and offers a dynamic range above 50 dB. The product targets loss- and polarization-characterization tasks on passive optical S-, C-, and L-band components. It suits labs and manufacturing environments.
The product can be used in conjunction with an external tunable laser to measure insertion loss (IL), polarization-dependent loss (PDL), second-order PMD, Jones matrix elements, time domain, and other performance indices. An upgrade path allows users to add chromatic dispersion (CD), group delay (GD), phase, and other test-and-measurement equipment options.
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