Acterna intros jitter/wander test capabilities for 10-Gbit/sec SONET/SDH and 10.7-Gbit/sec OTN systems

July 1, 2004
July 1, 2004 Germantown, MD -- Acterna has introduced what it claims is a first-of-its-kind solution that provides wander generation and analysis for 10 Gbits/sec and 10.7 Gbits/sec. According to the company, the solution is the first in the industry to provide four different sample rates for long-term, standard, and transient measurements.

July 1, 2004 Germantown, MD -- Acterna has introduced what it claims is a first-of-its-kind solution that provides wander generation and analysis for 10 Gbits/sec and 10.7 Gbits/sec. According to the company, the solution is the first in the industry to provide four different sample rates for long-term, standard, and transient measurements.

Accurate network synchronization, a prerequisite for 10- and 10.7-Gbit/sec network availability, is frequently difficult to achieve due to design challenges associated with achieving high performance while simultaneously reducing cost and power consumption. Designed for use with the ONT-50 Optical Network Tester and combined with the 10/10.7G module, Acterna's jitter and wander functionality provides the full set of measurement capabilities needed to measure wander parameters during installation, at routine intervals during operation, and after changes in the network topology, say company representatives. Performing wander measurements in parallel to other tests also results in lower costs and faster time to market.

"Traffic on optical networks at today's higher speeds requires a robust test solution that is standards-compliant, multi-functional, and dependable," contends Bernhard Mueller, general manager for Acterna's Optical Transport unit. "The Acterna ONT-50 with jitter and wander capability is designed to meet the demanding needs of both network operators and equipment manufacturers deploying 10G SONET/SDH and 10.7G OTN."

Additional features of Acterna's jitter/wander option for the ONT-50 include analysis of time interval error (TIE), MTIE, TDEV and frequency offset and drift rate with graphs and built-in masks that comply with all accepted and recommended industry standards; a separate wander reference clock input that accepts all standard clocks and data signals; and automated testing for wander tolerance.

The software's wander functionality at 10- and 10.7-Gbits/sec complies with ITU-T (0.172, G.811/812/813/823/824/825/783), Telcordia (GR-253, GR-1244), ETSI (EN302084/300462), and ANSI (T1.101, T1.105.09, T1.105.03) recommendations.

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