The 828 Series Optical Wavelength Meter employs a unique Fizeau etalon design that results in the ability to measure wavelength to an accuracy as high as ± 0.3 pm at an unmatched measurement rate of 1 kHz.
The 828 Series Optical Wavelength Meter employs a unique Fizeau etalon design that results in the ability to measure wavelength to an accuracy as high as ± 0.3 pm at an unmatched measurement rate of 1 kHz. This enables greater efficiency in the production of WDM components by reducing test times from hours to minutes. What’s more, a time resolution of 1 ms results in the most detailed wavelength characterization of tunable lasers.
