The CTP10 is a modular passive optical component testing platform that combines speed, accuracy, and flexibility. It offers reliable high-quality insertion loss (IL), return loss (RL), or polarization-dependent loss (PDL) measurement regardless of wavelength range or spectral characteristics of the device under test. It operates together with EXFO’s series of swept tunable lasers to perform these measurements within seconds and can be configured to acquire photocurrent measurements directly from external photodiodes.
Thanks to its modular configuration, it is the ideal instrument to characterize large port count components used in WDM networks and photonic integrated circuits (PIC).
Next-gen platform and modules
Thanks to its innovative approach, the CTP10 also greatly reduces setup time and simplifies spectral characterization by taking care of many complex operations. Indeed, tunable laser sweep, data collection and processing for IL, RL, or PDL, trace display, and analysis are all performed from a single instrument.
The CTP10 platform is compatible with a selection of key modules for spectral characterization (IL PDL & IL PDL OPM2 modules or IL RL OPM2), wavelength control (SCAN SYNC and FBC modules), optical detection (OPMx module) and photocurrent meters (PCMx module). These fully integrated modules are hot-swappable and quickly reconfigurable to greatly reduce setup time and provide a flexible and evolutive test solution.
The CTP10 can also be set up to receive external triggers coming from a tunable laser and record optical power or photocurrent as a function of wavelength. In this configuration, the CTP10 only requires OPMLite or PCM modules. The resolution, accuracy, and repeatability of the measurement lie with the laser, but the setup benefits from the detector's single gain range and fast averaging time. Additional capabilities include optical power time-logging suited for capturing optical transient phenomena and analog signal output suited for automated optical alignment processes.
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