SEPTEMBER 17, 2009 -- Luna Technologies announced its newest Optical Vector Analyzer platform, the OVA 5000. Luna touts the instrument as “the fastest, most accurate and economical tool for loss, dispersion and polarization measurements of modern optical networking equipment.”
The small footprint instrument is designed to provide single-measurement, all-parameter analysis of fiber-optic components and assemblies up to 150 m in length. With the new OVA 5000, a full C and L band characterization of all linear optical parameters can be completed in less than 3 seconds, the company asserts.
Luna’s patented characterization technique uses swept-wavelength interferometry to measure all device characteristics in a single scan of a tunable laser. The OVA is the only instrument measuring the complete linear transfer function of a device under test, Luna says. With this measurement, the OVA characterizes all linear optical parameters including insertion loss (IL), polarization-dependent loss (PDL), group delay (GD), chromatic dispersion (CD), polarization-mode dispersion (PMD), and second order PMD. It also measures the optical time domain response, the complex Jones Matrix elements, and the optical phase response.
“We offer a unique and unprecedented way of characterizing optical components that provides our customers with valuable benefits,” said Luna CTO Dr. Mark Froggatt. “Speed is incredibly important, which is where Luna has an edge. The OVA 5000 offers complete, rapid, single-scan measurement of all parameters in real-time which allows our DWDM component manufacturers to save time and money.”
Luna’s OVA 5000 is available within six to eight weeks from order placement.
Visit Luna Technologies